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TEM systems continue FEIís emphasis on technology leadership while redefining its product portfolio
September 2013
by Bruce Poorman  |  Email the author
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FEI Co.
 
FEI introduced three new systems that tailor the power of transmission electron microscopy (TEM) to specific application and industry needs. The new systems provide efficient and effective application-specific workflows for semiconductor manufacturing and scientific research. They include the new Metrios TEM for advanced semiconductor manufacturing metrology, Talos TEM that provides high-speed imaging and analysis for materials and life-science applications and the Titan Themis TEM for enhanced atomic-scale measurements of material properties.

FEI Co.
www.fei.com   
 

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